High-resolution X-ray diffraction and imaging

This issue of Journal of Applied Crystallography includes some highlights of the 11th Biennial Conference on High-Resolution X-ray Diffraction and Imaging (XTOP), held in St Petersburg in 2012.

Detalles Bibliográficos
Autores principales: Fewster, Paul F., Baidakova, Marina V., Kyutt, Reginald
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2013
Materias:
Editorial
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3769075/
https://www.ncbi.nlm.nih.gov/pubmed/24046485
http://dx.doi.org/10.1107/S0021889813016415
Descripción
Sumario:This issue of Journal of Applied Crystallography includes some highlights of the 11th Biennial Conference on High-Resolution X-ray Diffraction and Imaging (XTOP), held in St Petersburg in 2012.

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