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High-resolution X-ray diffraction and imaging

This issue of Journal of Applied Crystallography includes some highlights of the 11th Biennial Conference on High-Resolution X-ray Diffraction and Imaging (XTOP), held in St Petersburg in 2012.

Detalles Bibliográficos
Autores principales:	Fewster, Paul F., Baidakova, Marina V., Kyutt, Reginald
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	International Union of Crystallography 2013
Materias:	Editorial
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3769075/ https://www.ncbi.nlm.nih.gov/pubmed/24046485 http://dx.doi.org/10.1107/S0021889813016415

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