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The role of electron-stimulated desorption in focused electron beam induced deposition
We present the results of our study about the deposition rate of focused electron beam induced processing (FEBIP) as a function of the substrate temperature with the substrate being an electron-transparent amorphous carbon membrane. When W(CO)(6) is used as a precursor it is observed that the growth...
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Beilstein-Institut
2013
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3778412/ https://www.ncbi.nlm.nih.gov/pubmed/24062973 http://dx.doi.org/10.3762/bjnano.4.56 |
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author | van Dorp, Willem F Hansen, Thomas W Wagner, Jakob B De Hosson, Jeff T M |
author_facet | van Dorp, Willem F Hansen, Thomas W Wagner, Jakob B De Hosson, Jeff T M |
author_sort | van Dorp, Willem F |
collection | PubMed |
description | We present the results of our study about the deposition rate of focused electron beam induced processing (FEBIP) as a function of the substrate temperature with the substrate being an electron-transparent amorphous carbon membrane. When W(CO)(6) is used as a precursor it is observed that the growth rate is lower at higher substrate temperatures. From Arrhenius plots we calculated the activation energy for desorption, E(des), of W(CO)(6). We found an average value for E(des) of 20.3 kJ or 0.21 eV, which is 2.5–3.0 times lower than literature values. This difference between estimates for E(des) from FEBIP experiments compared to literature values is consistent with earlier findings by other authors. The discrepancy is attributed to electron-stimulated desorption, which is known to occur during electron irradiation. The data suggest that, of the W(CO)(6) molecules that are affected by the electron irradiation, the majority desorbs from the surface rather than dissociates to contribute to the deposit. It is important to take this into account during FEBIP experiments, for instance when determining fundamental process parameters such as the activation energy for desorption. |
format | Online Article Text |
id | pubmed-3778412 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2013 |
publisher | Beilstein-Institut |
record_format | MEDLINE/PubMed |
spelling | pubmed-37784122013-09-23 The role of electron-stimulated desorption in focused electron beam induced deposition van Dorp, Willem F Hansen, Thomas W Wagner, Jakob B De Hosson, Jeff T M Beilstein J Nanotechnol Full Research Paper We present the results of our study about the deposition rate of focused electron beam induced processing (FEBIP) as a function of the substrate temperature with the substrate being an electron-transparent amorphous carbon membrane. When W(CO)(6) is used as a precursor it is observed that the growth rate is lower at higher substrate temperatures. From Arrhenius plots we calculated the activation energy for desorption, E(des), of W(CO)(6). We found an average value for E(des) of 20.3 kJ or 0.21 eV, which is 2.5–3.0 times lower than literature values. This difference between estimates for E(des) from FEBIP experiments compared to literature values is consistent with earlier findings by other authors. The discrepancy is attributed to electron-stimulated desorption, which is known to occur during electron irradiation. The data suggest that, of the W(CO)(6) molecules that are affected by the electron irradiation, the majority desorbs from the surface rather than dissociates to contribute to the deposit. It is important to take this into account during FEBIP experiments, for instance when determining fundamental process parameters such as the activation energy for desorption. Beilstein-Institut 2013-08-14 /pmc/articles/PMC3778412/ /pubmed/24062973 http://dx.doi.org/10.3762/bjnano.4.56 Text en Copyright © 2013, van Dorp et al. https://creativecommons.org/licenses/by/2.0https://www.beilstein-journals.org/bjnano/termsThis is an Open Access article under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. The license is subject to the Beilstein Journal of Nanotechnology terms and conditions: (https://www.beilstein-journals.org/bjnano/terms) |
spellingShingle | Full Research Paper van Dorp, Willem F Hansen, Thomas W Wagner, Jakob B De Hosson, Jeff T M The role of electron-stimulated desorption in focused electron beam induced deposition |
title | The role of electron-stimulated desorption in focused electron beam induced deposition |
title_full | The role of electron-stimulated desorption in focused electron beam induced deposition |
title_fullStr | The role of electron-stimulated desorption in focused electron beam induced deposition |
title_full_unstemmed | The role of electron-stimulated desorption in focused electron beam induced deposition |
title_short | The role of electron-stimulated desorption in focused electron beam induced deposition |
title_sort | role of electron-stimulated desorption in focused electron beam induced deposition |
topic | Full Research Paper |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3778412/ https://www.ncbi.nlm.nih.gov/pubmed/24062973 http://dx.doi.org/10.3762/bjnano.4.56 |
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