An efficient methodology for measurement of the average electrical properties of single one-dimensional NiO nanorods

We utilized a metal tantalum (Ta) ball-probe to measure the electrical properties of vertical-aligned one-dimensional (1D) nickel-oxide (NiO) nanorods. The 1D NiO nanorods (on average, ~105 nm wide and ~700 nm long) are synthesized using the hot-filament metal-oxide vapor deposition (HFMOVD) techniq...

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Detalles Bibliográficos
Autores principales: Patil, Ranjit A., Devan, Rupesh S., Lin, Jin-Han, Liou, Yung, Ma, Yuan-Ron
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2013
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3810655/
https://www.ncbi.nlm.nih.gov/pubmed/24166185
http://dx.doi.org/10.1038/srep03070
Descripción
Sumario:We utilized a metal tantalum (Ta) ball-probe to measure the electrical properties of vertical-aligned one-dimensional (1D) nickel-oxide (NiO) nanorods. The 1D NiO nanorods (on average, ~105 nm wide and ~700 nm long) are synthesized using the hot-filament metal-oxide vapor deposition (HFMOVD) technique, and they are cubic phased and have a wide bandgap of 3.68 eV. When the 1D NiO nanorods are arranged in a large-area array in ohmic-contact with the Ta ball-probe, they acted as many parallel resistors. By means of a rigorous calculation, we can easily acquire the average resistance R(NR) and resistivity ρ(NR) of a single NiO nanorod, which were approximately 3.1 × 10(13) Ω and 4.9 × 10(7) Ω.cm, respectively.

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