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Energy dissipation and error probability in fault-tolerant binary switching
The potential energy profile of an ideal binary switch is a symmetric double well. Switching between the wells without energy dissipation requires time-modulating the height of the potential barrier separating the wells and tilting the profile towards the desired well at the precise juncture when th...
Autores principales: | , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group
2013
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3826093/ https://www.ncbi.nlm.nih.gov/pubmed/24220310 http://dx.doi.org/10.1038/srep03204 |
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author | Fashami, Mohammad Salehi Atulasimha, Jayasimha Bandyopadhyay, Supriyo |
author_facet | Fashami, Mohammad Salehi Atulasimha, Jayasimha Bandyopadhyay, Supriyo |
author_sort | Fashami, Mohammad Salehi |
collection | PubMed |
description | The potential energy profile of an ideal binary switch is a symmetric double well. Switching between the wells without energy dissipation requires time-modulating the height of the potential barrier separating the wells and tilting the profile towards the desired well at the precise juncture when the barrier disappears. This, however, demands perfect timing synchronization and is therefore fault-intolerant even in the absence of noise. A fault-tolerant strategy that requires no time modulation of the barrier (and hence no timing synchronization) switches by tilting the profile by an amount at least equal to the barrier height and dissipates at least that amount of energy in abrupt switching. Here, we present a third strategy that requires a time modulated barrier but no timing synchronization. It is therefore fault-tolerant, error-free in the absence of thermal noise, and yet it dissipates arbitrarily small energy in a noise-free environment since an arbitrarily small tilt is required for slow switching. This case is exemplified with stress induced switching of a shape-anisotropic single-domain soft nanomagnet dipole-coupled to a hard magnet. When thermal noise is present, we show analytically that the minimum energy dissipated to switch in this scheme is ~2kTln(1/p) [p = switching error probability]. |
format | Online Article Text |
id | pubmed-3826093 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2013 |
publisher | Nature Publishing Group |
record_format | MEDLINE/PubMed |
spelling | pubmed-38260932013-11-13 Energy dissipation and error probability in fault-tolerant binary switching Fashami, Mohammad Salehi Atulasimha, Jayasimha Bandyopadhyay, Supriyo Sci Rep Article The potential energy profile of an ideal binary switch is a symmetric double well. Switching between the wells without energy dissipation requires time-modulating the height of the potential barrier separating the wells and tilting the profile towards the desired well at the precise juncture when the barrier disappears. This, however, demands perfect timing synchronization and is therefore fault-intolerant even in the absence of noise. A fault-tolerant strategy that requires no time modulation of the barrier (and hence no timing synchronization) switches by tilting the profile by an amount at least equal to the barrier height and dissipates at least that amount of energy in abrupt switching. Here, we present a third strategy that requires a time modulated barrier but no timing synchronization. It is therefore fault-tolerant, error-free in the absence of thermal noise, and yet it dissipates arbitrarily small energy in a noise-free environment since an arbitrarily small tilt is required for slow switching. This case is exemplified with stress induced switching of a shape-anisotropic single-domain soft nanomagnet dipole-coupled to a hard magnet. When thermal noise is present, we show analytically that the minimum energy dissipated to switch in this scheme is ~2kTln(1/p) [p = switching error probability]. Nature Publishing Group 2013-11-13 /pmc/articles/PMC3826093/ /pubmed/24220310 http://dx.doi.org/10.1038/srep03204 Text en Copyright © 2013, Macmillan Publishers Limited. All rights reserved http://creativecommons.org/licenses/by-nc-sa/3.0/ This work is licensed under a Creative Commons Attribution-NonCommercial-ShareALike 3.0 Unported License. To view a copy of this license, visit http://creativecommons.org/licenses/by-nc-sa/3.0/ |
spellingShingle | Article Fashami, Mohammad Salehi Atulasimha, Jayasimha Bandyopadhyay, Supriyo Energy dissipation and error probability in fault-tolerant binary switching |
title | Energy dissipation and error probability in fault-tolerant binary switching |
title_full | Energy dissipation and error probability in fault-tolerant binary switching |
title_fullStr | Energy dissipation and error probability in fault-tolerant binary switching |
title_full_unstemmed | Energy dissipation and error probability in fault-tolerant binary switching |
title_short | Energy dissipation and error probability in fault-tolerant binary switching |
title_sort | energy dissipation and error probability in fault-tolerant binary switching |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3826093/ https://www.ncbi.nlm.nih.gov/pubmed/24220310 http://dx.doi.org/10.1038/srep03204 |
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