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Temporal resistance variation of the second generation HTS tape during superconducting-to-normal state transition

BACKGROUND: The quench process in high-temperature superconducting (HTS) wires plays an important role in superconducting power devices, such as fault current limiters, magnets, cables, etc. The superconducting device should survive after the overheating due to quench. METHODS: We studied the evolut...

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Detalles Bibliográficos
Autores principales: Malginov, Vladimir A, Malginov, Andrey V, Fleishman, Leonid S
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer International Publishing 2013
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3828451/
https://www.ncbi.nlm.nih.gov/pubmed/24255874
http://dx.doi.org/10.1186/2193-1801-2-599
Descripción
Sumario:BACKGROUND: The quench process in high-temperature superconducting (HTS) wires plays an important role in superconducting power devices, such as fault current limiters, magnets, cables, etc. The superconducting device should survive after the overheating due to quench. METHODS: We studied the evolution of the resistance of the YBCO tape wire during the quench process with 1 ms time resolution for various excitation voltages. FINDINGS: The resistive normal zone was found to be located in a domain of about 1-4 cm long. The normal state nucleation begins in 40-60 ms after voltage is applied across the HTS tape. In subsequent 200-300 ms other normal state regions appear. The normal domain heating continues in the following 5-10s that results in a factor of 2–3 increase of its resistance. CONCLUSIONS: Formation of the normal domain during the quench process follows the same stages for different excitation voltages. Characteristic domain sizes, lifetimes and temperatures are determined for all stages.