EFM data mapped into 2D images of tip-sample contact potential difference and capacitance second derivative

We report a simple technique for mapping Electrostatic Force Microscopy (EFM) bias sweep data into 2D images. The method allows simultaneous probing, in the same scanning area, of the contact potential difference and the second derivative of the capacitance between tip and sample, along with the hei...

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Autores principales: Lilliu, S., Maragliano, C., Hampton, M., Elliott, M., Stefancich, M., Chiesa, M., Dahlem, M. S., Macdonald, J. E.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2013
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3842085/
https://www.ncbi.nlm.nih.gov/pubmed/24284731
http://dx.doi.org/10.1038/srep03352
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author Lilliu, S.
Maragliano, C.
Hampton, M.
Elliott, M.
Stefancich, M.
Chiesa, M.
Dahlem, M. S.
Macdonald, J. E.
author_facet Lilliu, S.
Maragliano, C.
Hampton, M.
Elliott, M.
Stefancich, M.
Chiesa, M.
Dahlem, M. S.
Macdonald, J. E.
author_sort Lilliu, S.
collection PubMed
description We report a simple technique for mapping Electrostatic Force Microscopy (EFM) bias sweep data into 2D images. The method allows simultaneous probing, in the same scanning area, of the contact potential difference and the second derivative of the capacitance between tip and sample, along with the height information. The only required equipment consists of a microscope with lift-mode EFM capable of phase shift detection. We designate this approach as Scanning Probe Potential Electrostatic Force Microscopy (SPP-EFM). An open-source MATLAB Graphical User Interface (GUI) for images acquisition, processing and analysis has been developed. The technique is tested with Indium Tin Oxide (ITO) and with poly(3-hexylthiophene) (P3HT) nanowires for organic transistor applications.
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spelling pubmed-38420852013-11-27 EFM data mapped into 2D images of tip-sample contact potential difference and capacitance second derivative Lilliu, S. Maragliano, C. Hampton, M. Elliott, M. Stefancich, M. Chiesa, M. Dahlem, M. S. Macdonald, J. E. Sci Rep Article We report a simple technique for mapping Electrostatic Force Microscopy (EFM) bias sweep data into 2D images. The method allows simultaneous probing, in the same scanning area, of the contact potential difference and the second derivative of the capacitance between tip and sample, along with the height information. The only required equipment consists of a microscope with lift-mode EFM capable of phase shift detection. We designate this approach as Scanning Probe Potential Electrostatic Force Microscopy (SPP-EFM). An open-source MATLAB Graphical User Interface (GUI) for images acquisition, processing and analysis has been developed. The technique is tested with Indium Tin Oxide (ITO) and with poly(3-hexylthiophene) (P3HT) nanowires for organic transistor applications. Nature Publishing Group 2013-11-27 /pmc/articles/PMC3842085/ /pubmed/24284731 http://dx.doi.org/10.1038/srep03352 Text en Copyright © 2013, Macmillan Publishers Limited. All rights reserved http://creativecommons.org/licenses/by-nc-nd/3.0/ This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivs 3.0 Unported License. To view a copy of this license, visit http://creativecommons.org/licenses/by-nc-nd/3.0/
spellingShingle Article
Lilliu, S.
Maragliano, C.
Hampton, M.
Elliott, M.
Stefancich, M.
Chiesa, M.
Dahlem, M. S.
Macdonald, J. E.
EFM data mapped into 2D images of tip-sample contact potential difference and capacitance second derivative
title EFM data mapped into 2D images of tip-sample contact potential difference and capacitance second derivative
title_full EFM data mapped into 2D images of tip-sample contact potential difference and capacitance second derivative
title_fullStr EFM data mapped into 2D images of tip-sample contact potential difference and capacitance second derivative
title_full_unstemmed EFM data mapped into 2D images of tip-sample contact potential difference and capacitance second derivative
title_short EFM data mapped into 2D images of tip-sample contact potential difference and capacitance second derivative
title_sort efm data mapped into 2d images of tip-sample contact potential difference and capacitance second derivative
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3842085/
https://www.ncbi.nlm.nih.gov/pubmed/24284731
http://dx.doi.org/10.1038/srep03352
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