EFM data mapped into 2D images of tip-sample contact potential difference and capacitance second derivative

We report a simple technique for mapping Electrostatic Force Microscopy (EFM) bias sweep data into 2D images. The method allows simultaneous probing, in the same scanning area, of the contact potential difference and the second derivative of the capacitance between tip and sample, along with the hei...

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Detalles Bibliográficos
Autores principales: Lilliu, S., Maragliano, C., Hampton, M., Elliott, M., Stefancich, M., Chiesa, M., Dahlem, M. S., Macdonald, J. E.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2013
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3842085/
https://www.ncbi.nlm.nih.gov/pubmed/24284731
http://dx.doi.org/10.1038/srep03352

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