New approach for structural characterization of planar sets of nanoparticles embedded into a solid matrix

In this work we demonstrate that Medium Energy Ion Scattering (MEIS) measurements in combination with Transmission Electron Microscopy (TEM) or Grazing Incidence Small Angle X-Ray Scattering (GISAXS) can provide a complete characterization of nanoparticle (NP) systems embedded into dielectric films....

Descripción completa

Detalles Bibliográficos
Autores principales: Sanchez, Dario F., Marmitt, Gabriel, Marin, Cristiane, Baptista, Daniel L., de M. Azevedo, Gustavo, Grande, Pedro L., Fichtner, Paulo F. P.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2013
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3849636/
https://www.ncbi.nlm.nih.gov/pubmed/24301257
http://dx.doi.org/10.1038/srep03414

Ejemplares similares

Ejemplares similares