Cargando…
Retraction: Enhanced resistive switching memory characteristics and mechanism using a Ti nanolayer at the W/TaOx interface
Autores principales: | , , , , |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Springer
2013
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3853228/ https://www.ncbi.nlm.nih.gov/pubmed/24229327 http://dx.doi.org/10.1186/1556-276X-8-419 |
_version_ | 1782478802168840192 |
---|---|
author | Prakash, Amit Maikap, Siddheswar Chiu, Hsien-Chin Tien, Ta-Chang Lai, Chao-Sung |
author_facet | Prakash, Amit Maikap, Siddheswar Chiu, Hsien-Chin Tien, Ta-Chang Lai, Chao-Sung |
author_sort | Prakash, Amit |
collection | PubMed |
description | |
format | Online Article Text |
id | pubmed-3853228 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2013 |
publisher | Springer |
record_format | MEDLINE/PubMed |
spelling | pubmed-38532282013-12-11 Retraction: Enhanced resistive switching memory characteristics and mechanism using a Ti nanolayer at the W/TaOx interface Prakash, Amit Maikap, Siddheswar Chiu, Hsien-Chin Tien, Ta-Chang Lai, Chao-Sung Nanoscale Res Lett Retraction Springer 2013-10-22 /pmc/articles/PMC3853228/ /pubmed/24229327 http://dx.doi.org/10.1186/1556-276X-8-419 Text en Copyright © 2013 Prakash et al.; licensee Springer. http://creativecommons.org/licenses/by/2.0 This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. |
spellingShingle | Retraction Prakash, Amit Maikap, Siddheswar Chiu, Hsien-Chin Tien, Ta-Chang Lai, Chao-Sung Retraction: Enhanced resistive switching memory characteristics and mechanism using a Ti nanolayer at the W/TaOx interface |
title | Retraction: Enhanced resistive switching memory characteristics and mechanism using a Ti nanolayer at the W/TaOx interface |
title_full | Retraction: Enhanced resistive switching memory characteristics and mechanism using a Ti nanolayer at the W/TaOx interface |
title_fullStr | Retraction: Enhanced resistive switching memory characteristics and mechanism using a Ti nanolayer at the W/TaOx interface |
title_full_unstemmed | Retraction: Enhanced resistive switching memory characteristics and mechanism using a Ti nanolayer at the W/TaOx interface |
title_short | Retraction: Enhanced resistive switching memory characteristics and mechanism using a Ti nanolayer at the W/TaOx interface |
title_sort | retraction: enhanced resistive switching memory characteristics and mechanism using a ti nanolayer at the w/taox interface |
topic | Retraction |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3853228/ https://www.ncbi.nlm.nih.gov/pubmed/24229327 http://dx.doi.org/10.1186/1556-276X-8-419 |
work_keys_str_mv | AT prakashamit retractionenhancedresistiveswitchingmemorycharacteristicsandmechanismusingatinanolayeratthewtaoxinterface AT maikapsiddheswar retractionenhancedresistiveswitchingmemorycharacteristicsandmechanismusingatinanolayeratthewtaoxinterface AT chiuhsienchin retractionenhancedresistiveswitchingmemorycharacteristicsandmechanismusingatinanolayeratthewtaoxinterface AT tientachang retractionenhancedresistiveswitchingmemorycharacteristicsandmechanismusingatinanolayeratthewtaoxinterface AT laichaosung retractionenhancedresistiveswitchingmemorycharacteristicsandmechanismusingatinanolayeratthewtaoxinterface |