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Retraction: Enhanced resistive switching memory characteristics and mechanism using a Ti nanolayer at the W/TaOx interface

Detalles Bibliográficos
Autores principales: Prakash, Amit, Maikap, Siddheswar, Chiu, Hsien-Chin, Tien, Ta-Chang, Lai, Chao-Sung
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2013
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3853228/
https://www.ncbi.nlm.nih.gov/pubmed/24229327
http://dx.doi.org/10.1186/1556-276X-8-419
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author Prakash, Amit
Maikap, Siddheswar
Chiu, Hsien-Chin
Tien, Ta-Chang
Lai, Chao-Sung
author_facet Prakash, Amit
Maikap, Siddheswar
Chiu, Hsien-Chin
Tien, Ta-Chang
Lai, Chao-Sung
author_sort Prakash, Amit
collection PubMed
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spelling pubmed-38532282013-12-11 Retraction: Enhanced resistive switching memory characteristics and mechanism using a Ti nanolayer at the W/TaOx interface Prakash, Amit Maikap, Siddheswar Chiu, Hsien-Chin Tien, Ta-Chang Lai, Chao-Sung Nanoscale Res Lett Retraction Springer 2013-10-22 /pmc/articles/PMC3853228/ /pubmed/24229327 http://dx.doi.org/10.1186/1556-276X-8-419 Text en Copyright © 2013 Prakash et al.; licensee Springer. http://creativecommons.org/licenses/by/2.0 This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
spellingShingle Retraction
Prakash, Amit
Maikap, Siddheswar
Chiu, Hsien-Chin
Tien, Ta-Chang
Lai, Chao-Sung
Retraction: Enhanced resistive switching memory characteristics and mechanism using a Ti nanolayer at the W/TaOx interface
title Retraction: Enhanced resistive switching memory characteristics and mechanism using a Ti nanolayer at the W/TaOx interface
title_full Retraction: Enhanced resistive switching memory characteristics and mechanism using a Ti nanolayer at the W/TaOx interface
title_fullStr Retraction: Enhanced resistive switching memory characteristics and mechanism using a Ti nanolayer at the W/TaOx interface
title_full_unstemmed Retraction: Enhanced resistive switching memory characteristics and mechanism using a Ti nanolayer at the W/TaOx interface
title_short Retraction: Enhanced resistive switching memory characteristics and mechanism using a Ti nanolayer at the W/TaOx interface
title_sort retraction: enhanced resistive switching memory characteristics and mechanism using a ti nanolayer at the w/taox interface
topic Retraction
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3853228/
https://www.ncbi.nlm.nih.gov/pubmed/24229327
http://dx.doi.org/10.1186/1556-276X-8-419
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