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Highly uniform hole spacing micro brushes based on aligned carbon nanotube arrays

Highly uniform hole spacing micro brushes were fabricated based on aligned carbon nanotube (CNT) arrays synthesized by chemical vapor deposition method with the assistance of anodic aluminum oxide (AAO) template. Different micro brushes from CNT arrays were constructed on silicon, glass, and polyimi...

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Detalles Bibliográficos
Autores principales: Yang, Zhi, Zhu, Xingzhong, Huang, Xiaolu, Cheng, Yingwu, Liu, Yun, Geng, Huijuan, Wu, Yue, Su, Yanjie, Wei, Hao, Zhang, Yafei
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2013
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3879083/
https://www.ncbi.nlm.nih.gov/pubmed/24274897
http://dx.doi.org/10.1186/1556-276X-8-501
Descripción
Sumario:Highly uniform hole spacing micro brushes were fabricated based on aligned carbon nanotube (CNT) arrays synthesized by chemical vapor deposition method with the assistance of anodic aluminum oxide (AAO) template. Different micro brushes from CNT arrays were constructed on silicon, glass, and polyimide substrates, respectively. The micro brushes had highly uniform hole spacing originating from the regularly periodic pore structure of AAO template. The CNT arrays, serving as bristles, were firmly grafted on the substrates. The brushes can easily clean particles with scale of micrometer on the surface of silicon wafer and from the narrow spaces between the electrodes in a series of cleaning experiments. The results show the potential application of the CNT micro brushes as a cleaning tool in microelectronics manufacture field.