Fabrication of [001]-oriented tungsten tips for high resolution scanning tunneling microscopy

The structure of the [001]-oriented single crystalline tungsten probes sharpened in ultra-high vacuum using electron beam heating and ion sputtering has been studied using scanning and transmission electron microscopy. The electron microscopy data prove reproducible fabrication of the single-apex ti...

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Detalles Bibliográficos
Autores principales: Chaika, A. N., Orlova, N. N., Semenov, V. N., Postnova, E. Yu., Krasnikov, S. A., Lazarev, M. G., Chekmazov, S. V., Aristov, V. Yu., Glebovsky, V. G., Bozhko, S. I., Shvets, I. V.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2014
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3894555/
https://www.ncbi.nlm.nih.gov/pubmed/24434734
http://dx.doi.org/10.1038/srep03742
Descripción
Sumario:The structure of the [001]-oriented single crystalline tungsten probes sharpened in ultra-high vacuum using electron beam heating and ion sputtering has been studied using scanning and transmission electron microscopy. The electron microscopy data prove reproducible fabrication of the single-apex tips with nanoscale pyramids grained by the {011} planes at the apexes. These sharp, [001]-oriented tungsten tips have been successfully utilized in high resolution scanning tunneling microscopy imaging of HOPG(0001), SiC(001) and graphene/SiC(001) surfaces. The electron microscopy characterization performed before and after the high resolution STM experiments provides direct correlation between the tip structure and picoscale spatial resolution achieved in the experiments.

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