Cargando…
Potential sensitivities in frequency modulation and heterodyne amplitude modulation Kelvin probe force microscopes
In this paper, the potential sensitivity in Kelvin probe force microscopy (KPFM) was investigated in frequency modulation (FM) and heterodyne amplitude modulation (AM) modes. We showed theoretically that the minimum detectable contact potential difference (CPD) in FM-KPFM is higher than in heterodyn...
Autores principales: | Ma, Zong-Min, Mu, Ji-Liang, Tang, Jun, Xue, Hui, Zhang, Huan, Xue, Chen-Yang, Liu, Jun, Li, Yan-Jun |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Springer
2013
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3895793/ https://www.ncbi.nlm.nih.gov/pubmed/24350866 http://dx.doi.org/10.1186/1556-276X-8-532 |
Ejemplares similares
-
Dual-heterodyne Kelvin probe force microscopy
por: Grévin, Benjamin, et al.
Publicado: (2023) -
Potential Dip in Organic Photovoltaics Probed by Cross-sectional Kelvin Probe Force Microscopy
por: Lee, Jongjin, et al.
Publicado: (2018) -
Open-loop amplitude-modulation Kelvin probe force microscopy operated in single-pass PeakForce tapping mode
por: Stan, Gheorghe, et al.
Publicado: (2021) -
Noise performance of frequency modulation Kelvin force microscopy
por: Diesinger, Heinrich, et al.
Publicado: (2014) -
Low-Temperature Reduction of Graphene Oxide: Electrical Conductance and Scanning Kelvin Probe Force Microscopy
por: Slobodian, Oleksandr M., et al.
Publicado: (2018)