Cargando…
Origin of the improved mobility and photo-bias stability in a double-channel metal oxide transistor
This study examined the performance and photo-bias stability of double-channel ZnSnO/InZnO (ZTO/IZO) thin-film transistors. The field-effect mobility (μ(FE)) and photo-bias stability of the double-channel device were improved by increasing the thickness of the front IZO film (t(int)) compared to the...
Autores principales: | Jung, Hong Yoon, Kang, Youngho, Hwang, Ah Young, Lee, Chang Kyu, Han, Seungwu, Kim, Dae-Hwan, Bae, Jong-Uk, Shin, Woo-Sup, Jeong, Jae Kyeong |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group
2014
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3895876/ https://www.ncbi.nlm.nih.gov/pubmed/24441830 http://dx.doi.org/10.1038/srep03765 |
Ejemplares similares
-
Origin of Degradation Phenomenon under Drain Bias Stress for Oxide Thin Film Transistors using IGZO and IGO Channel Layers
por: Bak, Jun Yong, et al.
Publicado: (2015) -
Floating Ni Capping for High-Mobility p-Channel SnO Thin-Film Transistors
por: Shin, Min-Gyu, et al.
Publicado: (2020) -
Light-Induced Peroxide Formation in ZnO: Origin of Persistent Photoconductivity
por: Kang, Youngho, et al.
Publicado: (2016) -
First-Principles Calculations of Luminescence Spectra
of Real-Scale Quantum Dots
por: Kang, Sungwoo, et al.
Publicado: (2021) -
Transistor bias tables (germanium)
por: Wolfendale, Eric
Publicado: (1966)