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Locating Damage Using Integrated Global-Local Approach with Wireless Sensing System and Single-Chip Impedance Measurement Device

This study developed an integrated global-local approach for locating damage on building structures. A damage detection approach with a novel embedded frequency response function damage index (NEFDI) was proposed and embedded in the Imote2.NET-based wireless structural health monitoring (SHM) system...

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Detalles Bibliográficos
Autores principales: Lin, Tzu-Hsuan, Lu, Yung-Chi, Hung, Shih-Lin
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Hindawi Publishing Corporation 2014
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3930199/
https://www.ncbi.nlm.nih.gov/pubmed/24672359
http://dx.doi.org/10.1155/2014/729027
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author Lin, Tzu-Hsuan
Lu, Yung-Chi
Hung, Shih-Lin
author_facet Lin, Tzu-Hsuan
Lu, Yung-Chi
Hung, Shih-Lin
author_sort Lin, Tzu-Hsuan
collection PubMed
description This study developed an integrated global-local approach for locating damage on building structures. A damage detection approach with a novel embedded frequency response function damage index (NEFDI) was proposed and embedded in the Imote2.NET-based wireless structural health monitoring (SHM) system to locate global damage. Local damage is then identified using an electromechanical impedance- (EMI-) based damage detection method. The electromechanical impedance was measured using a single-chip impedance measurement device which has the advantages of small size, low cost, and portability. The feasibility of the proposed damage detection scheme was studied with reference to a numerical example of a six-storey shear plane frame structure and a small-scale experimental steel frame. Numerical and experimental analysis using the integrated global-local SHM approach reveals that, after NEFDI indicates the approximate location of a damaged area, the EMI-based damage detection approach can then identify the detailed damage location in the structure of the building.
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spelling pubmed-39301992014-03-26 Locating Damage Using Integrated Global-Local Approach with Wireless Sensing System and Single-Chip Impedance Measurement Device Lin, Tzu-Hsuan Lu, Yung-Chi Hung, Shih-Lin ScientificWorldJournal Research Article This study developed an integrated global-local approach for locating damage on building structures. A damage detection approach with a novel embedded frequency response function damage index (NEFDI) was proposed and embedded in the Imote2.NET-based wireless structural health monitoring (SHM) system to locate global damage. Local damage is then identified using an electromechanical impedance- (EMI-) based damage detection method. The electromechanical impedance was measured using a single-chip impedance measurement device which has the advantages of small size, low cost, and portability. The feasibility of the proposed damage detection scheme was studied with reference to a numerical example of a six-storey shear plane frame structure and a small-scale experimental steel frame. Numerical and experimental analysis using the integrated global-local SHM approach reveals that, after NEFDI indicates the approximate location of a damaged area, the EMI-based damage detection approach can then identify the detailed damage location in the structure of the building. Hindawi Publishing Corporation 2014-01-06 /pmc/articles/PMC3930199/ /pubmed/24672359 http://dx.doi.org/10.1155/2014/729027 Text en Copyright © 2014 Tzu-Hsuan Lin et al. https://creativecommons.org/licenses/by/3.0/ This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
spellingShingle Research Article
Lin, Tzu-Hsuan
Lu, Yung-Chi
Hung, Shih-Lin
Locating Damage Using Integrated Global-Local Approach with Wireless Sensing System and Single-Chip Impedance Measurement Device
title Locating Damage Using Integrated Global-Local Approach with Wireless Sensing System and Single-Chip Impedance Measurement Device
title_full Locating Damage Using Integrated Global-Local Approach with Wireless Sensing System and Single-Chip Impedance Measurement Device
title_fullStr Locating Damage Using Integrated Global-Local Approach with Wireless Sensing System and Single-Chip Impedance Measurement Device
title_full_unstemmed Locating Damage Using Integrated Global-Local Approach with Wireless Sensing System and Single-Chip Impedance Measurement Device
title_short Locating Damage Using Integrated Global-Local Approach with Wireless Sensing System and Single-Chip Impedance Measurement Device
title_sort locating damage using integrated global-local approach with wireless sensing system and single-chip impedance measurement device
topic Research Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3930199/
https://www.ncbi.nlm.nih.gov/pubmed/24672359
http://dx.doi.org/10.1155/2014/729027
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