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Energy losses of nanomechanical resonators induced by atomic force microscopy-controlled mechanical impedance mismatching
Clamping losses are a widely discussed damping mechanism in nanoelectromechanical systems, limiting the performance of these devices. Here we present a method to investigate this dissipation channel. Using an atomic force microscope tip as a local perturbation in the clamping region of a nanoelectro...
Autores principales: | , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Pub. Group
2014
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3959189/ https://www.ncbi.nlm.nih.gov/pubmed/24594876 http://dx.doi.org/10.1038/ncomms4345 |
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author | Rieger, Johannes Isacsson, Andreas Seitner, Maximilian J. Kotthaus, Jörg P. Weig, Eva M. |
author_facet | Rieger, Johannes Isacsson, Andreas Seitner, Maximilian J. Kotthaus, Jörg P. Weig, Eva M. |
author_sort | Rieger, Johannes |
collection | PubMed |
description | Clamping losses are a widely discussed damping mechanism in nanoelectromechanical systems, limiting the performance of these devices. Here we present a method to investigate this dissipation channel. Using an atomic force microscope tip as a local perturbation in the clamping region of a nanoelectromechanical resonator, we increase the energy loss of its flexural modes by at least one order of magnitude. We explain this by a transfer of vibrational energy into the cantilever, which is theoretically described by a reduced mechanical impedance mismatch between the resonator and its environment. A theoretical model for this mismatch, in conjunction with finite element simulations of the evanescent strain field of the mechanical modes in the clamping region, allows us to quantitatively analyse data on position and force dependence of the tip-induced damping. Our experiments yield insights into the damping of nanoelectromechanical systems with the prospect of engineering the energy exchange in resonator networks. |
format | Online Article Text |
id | pubmed-3959189 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2014 |
publisher | Nature Pub. Group |
record_format | MEDLINE/PubMed |
spelling | pubmed-39591892014-03-20 Energy losses of nanomechanical resonators induced by atomic force microscopy-controlled mechanical impedance mismatching Rieger, Johannes Isacsson, Andreas Seitner, Maximilian J. Kotthaus, Jörg P. Weig, Eva M. Nat Commun Article Clamping losses are a widely discussed damping mechanism in nanoelectromechanical systems, limiting the performance of these devices. Here we present a method to investigate this dissipation channel. Using an atomic force microscope tip as a local perturbation in the clamping region of a nanoelectromechanical resonator, we increase the energy loss of its flexural modes by at least one order of magnitude. We explain this by a transfer of vibrational energy into the cantilever, which is theoretically described by a reduced mechanical impedance mismatch between the resonator and its environment. A theoretical model for this mismatch, in conjunction with finite element simulations of the evanescent strain field of the mechanical modes in the clamping region, allows us to quantitatively analyse data on position and force dependence of the tip-induced damping. Our experiments yield insights into the damping of nanoelectromechanical systems with the prospect of engineering the energy exchange in resonator networks. Nature Pub. Group 2014-03-04 /pmc/articles/PMC3959189/ /pubmed/24594876 http://dx.doi.org/10.1038/ncomms4345 Text en Copyright © 2014, Nature Publishing Group, a division of Macmillan Publishers Limited. All Rights Reserved. http://creativecommons.org/licenses/by-nc-sa/3.0/ This work is licensed under a Creative Commons Attribution-NonCommercial-ShareAlike 3.0 Unported License. To view a copy of this license, visit http://creativecommons.org/licenses/by-nc-sa/3.0/ |
spellingShingle | Article Rieger, Johannes Isacsson, Andreas Seitner, Maximilian J. Kotthaus, Jörg P. Weig, Eva M. Energy losses of nanomechanical resonators induced by atomic force microscopy-controlled mechanical impedance mismatching |
title | Energy losses of nanomechanical resonators induced by atomic force microscopy-controlled mechanical impedance mismatching |
title_full | Energy losses of nanomechanical resonators induced by atomic force microscopy-controlled mechanical impedance mismatching |
title_fullStr | Energy losses of nanomechanical resonators induced by atomic force microscopy-controlled mechanical impedance mismatching |
title_full_unstemmed | Energy losses of nanomechanical resonators induced by atomic force microscopy-controlled mechanical impedance mismatching |
title_short | Energy losses of nanomechanical resonators induced by atomic force microscopy-controlled mechanical impedance mismatching |
title_sort | energy losses of nanomechanical resonators induced by atomic force microscopy-controlled mechanical impedance mismatching |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3959189/ https://www.ncbi.nlm.nih.gov/pubmed/24594876 http://dx.doi.org/10.1038/ncomms4345 |
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