Energy losses of nanomechanical resonators induced by atomic force microscopy-controlled mechanical impedance mismatching

Clamping losses are a widely discussed damping mechanism in nanoelectromechanical systems, limiting the performance of these devices. Here we present a method to investigate this dissipation channel. Using an atomic force microscope tip as a local perturbation in the clamping region of a nanoelectro...

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Detalles Bibliográficos
Autores principales: Rieger, Johannes, Isacsson, Andreas, Seitner, Maximilian J., Kotthaus, Jörg P., Weig, Eva M.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Pub. Group 2014
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3959189/
https://www.ncbi.nlm.nih.gov/pubmed/24594876
http://dx.doi.org/10.1038/ncomms4345

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3959189/
https://www.ncbi.nlm.nih.gov/pubmed/24594876
http://dx.doi.org/10.1038/ncomms4345

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