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Energy losses of nanomechanical resonators induced by atomic force microscopy-controlled mechanical impedance mismatching
Clamping losses are a widely discussed damping mechanism in nanoelectromechanical systems, limiting the performance of these devices. Here we present a method to investigate this dissipation channel. Using an atomic force microscope tip as a local perturbation in the clamping region of a nanoelectro...
Autores principales: | Rieger, Johannes, Isacsson, Andreas, Seitner, Maximilian J., Kotthaus, Jörg P., Weig, Eva M. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Pub. Group
2014
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3959189/ https://www.ncbi.nlm.nih.gov/pubmed/24594876 http://dx.doi.org/10.1038/ncomms4345 |
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