Cargando…
Quantitative Accelerated Life Testing of MEMS Accelerometers
Quantitative Accelerated Life Testing (QALT) is a solution for assessing the reliability of Micro Electro Mechanical Systems (MEMS). A procedure for QALT is shown in this paper and an attempt to assess the reliability level for a batch of MEMS accelerometers is reported. The testing plan is applicat...
Autores principales: | , , , , , |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Molecular Diversity Preservation International (MDPI)
2007
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3965216/ https://www.ncbi.nlm.nih.gov/pubmed/28903265 |
_version_ | 1782479308794626048 |
---|---|
author | Bâzu, Marius Gălăţeanu, Lucian Ilian, Virgil Emil Loicq, Jerome Habraken, Serge Collette, Jean-Paul |
author_facet | Bâzu, Marius Gălăţeanu, Lucian Ilian, Virgil Emil Loicq, Jerome Habraken, Serge Collette, Jean-Paul |
author_sort | Bâzu, Marius |
collection | PubMed |
description | Quantitative Accelerated Life Testing (QALT) is a solution for assessing the reliability of Micro Electro Mechanical Systems (MEMS). A procedure for QALT is shown in this paper and an attempt to assess the reliability level for a batch of MEMS accelerometers is reported. The testing plan is application-driven and contains combined tests: thermal (high temperature) and mechanical stress. Two variants of mechanical stress are used: vibration (at a fixed frequency) and tilting. Original equipment for testing at tilting and high temperature is used. Tilting is appropriate as application-driven stress, because the tilt movement is a natural environment for devices used for automotive and aerospace applications. Also, tilting is used by MEMS accelerometers for anti-theft systems. The test results demonstrated the excellent reliability of the studied devices, the failure rate in the “worst case” being smaller than 10(-7)h(-1). |
format | Online Article Text |
id | pubmed-3965216 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2007 |
publisher | Molecular Diversity Preservation International (MDPI) |
record_format | MEDLINE/PubMed |
spelling | pubmed-39652162014-03-25 Quantitative Accelerated Life Testing of MEMS Accelerometers Bâzu, Marius Gălăţeanu, Lucian Ilian, Virgil Emil Loicq, Jerome Habraken, Serge Collette, Jean-Paul Sensors (Basel) Full Research Paper Quantitative Accelerated Life Testing (QALT) is a solution for assessing the reliability of Micro Electro Mechanical Systems (MEMS). A procedure for QALT is shown in this paper and an attempt to assess the reliability level for a batch of MEMS accelerometers is reported. The testing plan is application-driven and contains combined tests: thermal (high temperature) and mechanical stress. Two variants of mechanical stress are used: vibration (at a fixed frequency) and tilting. Original equipment for testing at tilting and high temperature is used. Tilting is appropriate as application-driven stress, because the tilt movement is a natural environment for devices used for automotive and aerospace applications. Also, tilting is used by MEMS accelerometers for anti-theft systems. The test results demonstrated the excellent reliability of the studied devices, the failure rate in the “worst case” being smaller than 10(-7)h(-1). Molecular Diversity Preservation International (MDPI) 2007-11-20 /pmc/articles/PMC3965216/ /pubmed/28903265 Text en © 2007 by MDPI (http://www.mdpi.org). Reproduction is permitted for noncommercial purposes. |
spellingShingle | Full Research Paper Bâzu, Marius Gălăţeanu, Lucian Ilian, Virgil Emil Loicq, Jerome Habraken, Serge Collette, Jean-Paul Quantitative Accelerated Life Testing of MEMS Accelerometers |
title | Quantitative Accelerated Life Testing of MEMS Accelerometers |
title_full | Quantitative Accelerated Life Testing of MEMS Accelerometers |
title_fullStr | Quantitative Accelerated Life Testing of MEMS Accelerometers |
title_full_unstemmed | Quantitative Accelerated Life Testing of MEMS Accelerometers |
title_short | Quantitative Accelerated Life Testing of MEMS Accelerometers |
title_sort | quantitative accelerated life testing of mems accelerometers |
topic | Full Research Paper |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3965216/ https://www.ncbi.nlm.nih.gov/pubmed/28903265 |
work_keys_str_mv | AT bazumarius quantitativeacceleratedlifetestingofmemsaccelerometers AT galateanulucian quantitativeacceleratedlifetestingofmemsaccelerometers AT ilianvirgilemil quantitativeacceleratedlifetestingofmemsaccelerometers AT loicqjerome quantitativeacceleratedlifetestingofmemsaccelerometers AT habrakenserge quantitativeacceleratedlifetestingofmemsaccelerometers AT collettejeanpaul quantitativeacceleratedlifetestingofmemsaccelerometers |