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Quantitative Accelerated Life Testing of MEMS Accelerometers
Quantitative Accelerated Life Testing (QALT) is a solution for assessing the reliability of Micro Electro Mechanical Systems (MEMS). A procedure for QALT is shown in this paper and an attempt to assess the reliability level for a batch of MEMS accelerometers is reported. The testing plan is applicat...
Autores principales: | Bâzu, Marius, Gălăţeanu, Lucian, Ilian, Virgil Emil, Loicq, Jerome, Habraken, Serge, Collette, Jean-Paul |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Molecular Diversity Preservation International (MDPI)
2007
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3965216/ https://www.ncbi.nlm.nih.gov/pubmed/28903265 |
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