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Memory Impedance in TiO(2) based Metal-Insulator-Metal Devices
Large attention has recently been given to a novel technology named memristor, for having the potential of becoming the new electronic device standard. Yet, its manifestation as the fourth missing element is rather controversial among scientists. Here we demonstrate that TiO(2)-based metal-insulator...
Autores principales: | , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group
2014
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3970129/ https://www.ncbi.nlm.nih.gov/pubmed/24682245 http://dx.doi.org/10.1038/srep04522 |
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author | Qingjiang, Li Khiat, Ali Salaoru, Iulia Papavassiliou, Christos Hui, Xu Prodromakis, Themistoklis |
author_facet | Qingjiang, Li Khiat, Ali Salaoru, Iulia Papavassiliou, Christos Hui, Xu Prodromakis, Themistoklis |
author_sort | Qingjiang, Li |
collection | PubMed |
description | Large attention has recently been given to a novel technology named memristor, for having the potential of becoming the new electronic device standard. Yet, its manifestation as the fourth missing element is rather controversial among scientists. Here we demonstrate that TiO(2)-based metal-insulator-metal devices are more than just a memory-resistor. They possess resistive, capacitive and inductive components that can concurrently be programmed; essentially exhibiting a convolution of memristive, memcapacitive and meminductive effects. We show how non-zero crossing current-voltage hysteresis loops can appear and we experimentally demonstrate their frequency response as memcapacitive and meminductive effects become dominant. |
format | Online Article Text |
id | pubmed-3970129 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2014 |
publisher | Nature Publishing Group |
record_format | MEDLINE/PubMed |
spelling | pubmed-39701292014-04-01 Memory Impedance in TiO(2) based Metal-Insulator-Metal Devices Qingjiang, Li Khiat, Ali Salaoru, Iulia Papavassiliou, Christos Hui, Xu Prodromakis, Themistoklis Sci Rep Article Large attention has recently been given to a novel technology named memristor, for having the potential of becoming the new electronic device standard. Yet, its manifestation as the fourth missing element is rather controversial among scientists. Here we demonstrate that TiO(2)-based metal-insulator-metal devices are more than just a memory-resistor. They possess resistive, capacitive and inductive components that can concurrently be programmed; essentially exhibiting a convolution of memristive, memcapacitive and meminductive effects. We show how non-zero crossing current-voltage hysteresis loops can appear and we experimentally demonstrate their frequency response as memcapacitive and meminductive effects become dominant. Nature Publishing Group 2014-03-31 /pmc/articles/PMC3970129/ /pubmed/24682245 http://dx.doi.org/10.1038/srep04522 Text en Copyright © 2014, Macmillan Publishers Limited. All rights reserved http://creativecommons.org/licenses/by/3.0/ This work is licensed under a Creative Commons Attribution 3.0 Unported License. The images in this article are included in the article's Creative Commons license, unless indicated otherwise in the image credit; if the image is not included under the Creative Commons license, users will need to obtain permission from the license holder in order to reproduce the image. To view a copy of this license, visit http://creativecommons.org/licenses/by/3.0/ |
spellingShingle | Article Qingjiang, Li Khiat, Ali Salaoru, Iulia Papavassiliou, Christos Hui, Xu Prodromakis, Themistoklis Memory Impedance in TiO(2) based Metal-Insulator-Metal Devices |
title | Memory Impedance in TiO(2) based Metal-Insulator-Metal Devices |
title_full | Memory Impedance in TiO(2) based Metal-Insulator-Metal Devices |
title_fullStr | Memory Impedance in TiO(2) based Metal-Insulator-Metal Devices |
title_full_unstemmed | Memory Impedance in TiO(2) based Metal-Insulator-Metal Devices |
title_short | Memory Impedance in TiO(2) based Metal-Insulator-Metal Devices |
title_sort | memory impedance in tio(2) based metal-insulator-metal devices |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3970129/ https://www.ncbi.nlm.nih.gov/pubmed/24682245 http://dx.doi.org/10.1038/srep04522 |
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