An infrastructure for accurate characterization of single-event transients in digital circuits()

We present the architecture and a detailed pre-fabrication analysis of a digital measurement ASIC facilitating long-term irradiation experiments of basic asynchronous circuits, which also demonstrates the suitability of the general approach for obtaining accurate radiation failure models developed i...

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Detalles Bibliográficos
Autores principales: Savulimedu Veeravalli, Varadan, Polzer, Thomas, Schmid, Ulrich, Steininger, Andreas, Hofbauer, Michael, Schweiger, Kurt, Dietrich, Horst, Schneider-Hornstein, Kerstin, Zimmermann, Horst, Voss, Kay-Obbe, Merk, Bruno, Hajek, Michael
Formato: Online Artículo Texto
Lenguaje:English
Publicado: IPC Science and Technology Press] 2013
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3990448/
https://www.ncbi.nlm.nih.gov/pubmed/24748694
http://dx.doi.org/10.1016/j.micpro.2013.04.011

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3990448/
https://www.ncbi.nlm.nih.gov/pubmed/24748694
http://dx.doi.org/10.1016/j.micpro.2013.04.011

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