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An infrastructure for accurate characterization of single-event transients in digital circuits()
We present the architecture and a detailed pre-fabrication analysis of a digital measurement ASIC facilitating long-term irradiation experiments of basic asynchronous circuits, which also demonstrates the suitability of the general approach for obtaining accurate radiation failure models developed i...
| Autores principales: | , , , , , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
IPC Science and Technology Press]
2013
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC3990448/ https://www.ncbi.nlm.nih.gov/pubmed/24748694 http://dx.doi.org/10.1016/j.micpro.2013.04.011 |