Quantitatively estimating defects in graphene devices using discharge current analysis method

Defects of graphene are the most important concern for the successful applications of graphene since they affect device performance significantly. However, once the graphene is integrated in the device structures, the quality of graphene and surrounding environment could only be assessed using indir...

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Detalles Bibliográficos
Autores principales: Jung, Ukjin, Lee, Young Gon, Kang, Chang Goo, Lee, Sangchul, Kim, Jin Ju, Hwang, Hyeon June, Lim, Sung Kwan, Ham, Moon-Ho, Lee, Byoung Hun
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2014
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4013935/
https://www.ncbi.nlm.nih.gov/pubmed/24811431
http://dx.doi.org/10.1038/srep04886

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4013935/
https://www.ncbi.nlm.nih.gov/pubmed/24811431
http://dx.doi.org/10.1038/srep04886

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