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Quantitatively estimating defects in graphene devices using discharge current analysis method
Defects of graphene are the most important concern for the successful applications of graphene since they affect device performance significantly. However, once the graphene is integrated in the device structures, the quality of graphene and surrounding environment could only be assessed using indir...
| Autores principales: | , , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group
2014
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4013935/ https://www.ncbi.nlm.nih.gov/pubmed/24811431 http://dx.doi.org/10.1038/srep04886 |