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Ultrafast Optical Properties of Dense Electron Gas in Silicon Nanostructures
We investigate the ultrafast dynamics of carriers in a silicon nanostructure by performing spectrally resolved femtosecond spectroscopy measurements with a supercontinuum probe. The nanostructure consists of a 158-nm-thick crystalline Si layer on top of which a SiO(2) passivation layer leads to a ve...
Autores principales: | Sieradzki, A., Basta, M., Scharoch, P., Bigot, J.-Y. |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Springer US
2013
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4018487/ https://www.ncbi.nlm.nih.gov/pubmed/24834018 http://dx.doi.org/10.1007/s11468-013-9658-z |
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