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Ultrafast Optical Properties of Dense Electron Gas in Silicon Nanostructures

We investigate the ultrafast dynamics of carriers in a silicon nanostructure by performing spectrally resolved femtosecond spectroscopy measurements with a supercontinuum probe. The nanostructure consists of a 158-nm-thick crystalline Si layer on top of which a SiO(2) passivation layer leads to a ve...

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Detalles Bibliográficos
Autores principales:	Sieradzki, A., Basta, M., Scharoch, P., Bigot, J.-Y.
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Springer US 2013
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4018487/ https://www.ncbi.nlm.nih.gov/pubmed/24834018 http://dx.doi.org/10.1007/s11468-013-9658-z

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