Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM tip

ABSTRACT: A single 210-nm Teflon nanoparticle (sTNP) was attached to the vertex of a silicon nitride (Si(3)N(4)) atomic force microscope tip and charged via contact electrification. The charged sTNP can then be considered a point charge and used to measure the electrostatic field adjacent to a paral...

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Detalles Bibliográficos
Autores principales: Chang, Joe-Ming, Chang, Wei-Yu, Chen, Fu-Rong, Tseng, Fan-Gang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2013
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4029376/
https://www.ncbi.nlm.nih.gov/pubmed/24314111
http://dx.doi.org/10.1186/1556-276X-8-519
Descripción
Sumario:ABSTRACT: A single 210-nm Teflon nanoparticle (sTNP) was attached to the vertex of a silicon nitride (Si(3)N(4)) atomic force microscope tip and charged via contact electrification. The charged sTNP can then be considered a point charge and used to measure the electrostatic field adjacent to a parallel plate condenser using 30-nm gold/20-nm titanium as electrodes. This technique can provide a measurement resolution of 250/100 nm along the X- and Z-axes, and the minimum electrostatic force can be measured within 50 pN. PACS: 07.79.Lh, 81.16.-c, 84.37. + q

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