Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM tip

ABSTRACT: A single 210-nm Teflon nanoparticle (sTNP) was attached to the vertex of a silicon nitride (Si(3)N(4)) atomic force microscope tip and charged via contact electrification. The charged sTNP can then be considered a point charge and used to measure the electrostatic field adjacent to a paral...

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Detalles Bibliográficos
Autores principales: Chang, Joe-Ming, Chang, Wei-Yu, Chen, Fu-Rong, Tseng, Fan-Gang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2013
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4029376/
https://www.ncbi.nlm.nih.gov/pubmed/24314111
http://dx.doi.org/10.1186/1556-276X-8-519
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author Chang, Joe-Ming
Chang, Wei-Yu
Chen, Fu-Rong
Tseng, Fan-Gang
author_facet Chang, Joe-Ming
Chang, Wei-Yu
Chen, Fu-Rong
Tseng, Fan-Gang
author_sort Chang, Joe-Ming
collection PubMed
description ABSTRACT: A single 210-nm Teflon nanoparticle (sTNP) was attached to the vertex of a silicon nitride (Si(3)N(4)) atomic force microscope tip and charged via contact electrification. The charged sTNP can then be considered a point charge and used to measure the electrostatic field adjacent to a parallel plate condenser using 30-nm gold/20-nm titanium as electrodes. This technique can provide a measurement resolution of 250/100 nm along the X- and Z-axes, and the minimum electrostatic force can be measured within 50 pN. PACS: 07.79.Lh, 81.16.-c, 84.37. + q
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spelling pubmed-40293762014-06-04 Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM tip Chang, Joe-Ming Chang, Wei-Yu Chen, Fu-Rong Tseng, Fan-Gang Nanoscale Res Lett Nano Express ABSTRACT: A single 210-nm Teflon nanoparticle (sTNP) was attached to the vertex of a silicon nitride (Si(3)N(4)) atomic force microscope tip and charged via contact electrification. The charged sTNP can then be considered a point charge and used to measure the electrostatic field adjacent to a parallel plate condenser using 30-nm gold/20-nm titanium as electrodes. This technique can provide a measurement resolution of 250/100 nm along the X- and Z-axes, and the minimum electrostatic force can be measured within 50 pN. PACS: 07.79.Lh, 81.16.-c, 84.37. + q Springer 2013-12-07 /pmc/articles/PMC4029376/ /pubmed/24314111 http://dx.doi.org/10.1186/1556-276X-8-519 Text en Copyright © 2013 Chang et al.; licensee Springer. http://creativecommons.org/licenses/by/2.0 This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
spellingShingle Nano Express
Chang, Joe-Ming
Chang, Wei-Yu
Chen, Fu-Rong
Tseng, Fan-Gang
Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM tip
title Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM tip
title_full Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM tip
title_fullStr Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM tip
title_full_unstemmed Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM tip
title_short Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM tip
title_sort direct measurement of electrostatic fields using single teflon nanoparticle attached to afm tip
topic Nano Express
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4029376/
https://www.ncbi.nlm.nih.gov/pubmed/24314111
http://dx.doi.org/10.1186/1556-276X-8-519
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