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Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM tip
ABSTRACT: A single 210-nm Teflon nanoparticle (sTNP) was attached to the vertex of a silicon nitride (Si(3)N(4)) atomic force microscope tip and charged via contact electrification. The charged sTNP can then be considered a point charge and used to measure the electrostatic field adjacent to a paral...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Springer
2013
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4029376/ https://www.ncbi.nlm.nih.gov/pubmed/24314111 http://dx.doi.org/10.1186/1556-276X-8-519 |