Mapping the continuous reciprocal space intensity distribution of X-ray serial crystallography

Serial crystallography using X-ray free-electron lasers enables the collection of tens of thousands of measurements from an equal number of individual crystals, each of which can be smaller than 1 µm in size. This manuscript describes an alternative way of handling diffraction data recorded by seria...

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Detalles Bibliográficos
Autores principales: Yefanov, Oleksandr, Gati, Cornelius, Bourenkov, Gleb, Kirian, Richard A., White, Thomas A., Spence, John C. H., Chapman, Henry N., Barty, Anton
Formato: Online Artículo Texto
Lenguaje:English
Publicado: The Royal Society 2014
Materias:
Part II: Technique development
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4052869/
https://www.ncbi.nlm.nih.gov/pubmed/24914160
http://dx.doi.org/10.1098/rstb.2013.0333

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4052869/
https://www.ncbi.nlm.nih.gov/pubmed/24914160
http://dx.doi.org/10.1098/rstb.2013.0333

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