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Mapping the continuous reciprocal space intensity distribution of X-ray serial crystallography
Serial crystallography using X-ray free-electron lasers enables the collection of tens of thousands of measurements from an equal number of individual crystals, each of which can be smaller than 1 µm in size. This manuscript describes an alternative way of handling diffraction data recorded by seria...
| Autores principales: | , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
The Royal Society
2014
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4052869/ https://www.ncbi.nlm.nih.gov/pubmed/24914160 http://dx.doi.org/10.1098/rstb.2013.0333 |