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Resistive switching and its suppression in Pt/Nb:SrTiO(3) junctions
Oxide-based resistive switching devices are promising candidates for new memory and computing technologies. Poor understanding of the defect-based mechanisms that give rise to resistive switching is a major impediment for engineering reliable and reproducible devices. Here we identify an unintention...
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Pub. Group
2014
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4059928/ https://www.ncbi.nlm.nih.gov/pubmed/24886761 http://dx.doi.org/10.1038/ncomms4990 |
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author | Mikheev, Evgeny Hoskins, Brian D. Strukov, Dmitri B. Stemmer, Susanne |
author_facet | Mikheev, Evgeny Hoskins, Brian D. Strukov, Dmitri B. Stemmer, Susanne |
author_sort | Mikheev, Evgeny |
collection | PubMed |
description | Oxide-based resistive switching devices are promising candidates for new memory and computing technologies. Poor understanding of the defect-based mechanisms that give rise to resistive switching is a major impediment for engineering reliable and reproducible devices. Here we identify an unintentional interface layer as the origin of resistive switching in Pt/Nb:SrTiO(3) junctions. We clarify the microscopic mechanisms by which the interface layer controls the resistive switching. We show that appropriate interface processing can eliminate this contribution. These findings are an important step towards engineering more reliable resistive switching devices. |
format | Online Article Text |
id | pubmed-4059928 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2014 |
publisher | Nature Pub. Group |
record_format | MEDLINE/PubMed |
spelling | pubmed-40599282014-06-18 Resistive switching and its suppression in Pt/Nb:SrTiO(3) junctions Mikheev, Evgeny Hoskins, Brian D. Strukov, Dmitri B. Stemmer, Susanne Nat Commun Article Oxide-based resistive switching devices are promising candidates for new memory and computing technologies. Poor understanding of the defect-based mechanisms that give rise to resistive switching is a major impediment for engineering reliable and reproducible devices. Here we identify an unintentional interface layer as the origin of resistive switching in Pt/Nb:SrTiO(3) junctions. We clarify the microscopic mechanisms by which the interface layer controls the resistive switching. We show that appropriate interface processing can eliminate this contribution. These findings are an important step towards engineering more reliable resistive switching devices. Nature Pub. Group 2014-06-02 /pmc/articles/PMC4059928/ /pubmed/24886761 http://dx.doi.org/10.1038/ncomms4990 Text en Copyright © 2014, Nature Publishing Group, a division of Macmillan Publishers Limited. All Rights Reserved. http://creativecommons.org/licenses/by-nc-by/3.0/ This work is licensed under a Creative Commons Attribution 3.0 Unported License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/3.0/ |
spellingShingle | Article Mikheev, Evgeny Hoskins, Brian D. Strukov, Dmitri B. Stemmer, Susanne Resistive switching and its suppression in Pt/Nb:SrTiO(3) junctions |
title | Resistive switching and its suppression in Pt/Nb:SrTiO(3) junctions |
title_full | Resistive switching and its suppression in Pt/Nb:SrTiO(3) junctions |
title_fullStr | Resistive switching and its suppression in Pt/Nb:SrTiO(3) junctions |
title_full_unstemmed | Resistive switching and its suppression in Pt/Nb:SrTiO(3) junctions |
title_short | Resistive switching and its suppression in Pt/Nb:SrTiO(3) junctions |
title_sort | resistive switching and its suppression in pt/nb:srtio(3) junctions |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4059928/ https://www.ncbi.nlm.nih.gov/pubmed/24886761 http://dx.doi.org/10.1038/ncomms4990 |
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