Principal Component Analysis (PCA)-Assisted Time-of-Flight Secondary-Ion Mass Spectrometry (ToF-SIMS): A Versatile Method for the Investigation of Self-Assembled Monolayers and Multilayers as Precursors for the Bottom-Up Approach of Nanoscaled Devices

[Image: see text] The production of high-quality self-assembled monolayers (SAMs) followed by layer-by-layer (LbL) self-assembly of macrocycles is essential for nanotechnology applications based on functional surface films. To help interpret the large amount of data generated by a standard ToF-SIMS...

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Detalles Bibliográficos
Autores principales: Holzweber, Markus, Heinrich, Thomas, Kunz, Valentin, Richter, Sebastian, Traulsen, Christoph H.-H., Schalley, Christoph A., Unger, Wolfgang E. S.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2014
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4063724/
https://www.ncbi.nlm.nih.gov/pubmed/24831785
http://dx.doi.org/10.1021/ac500059a

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