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Scanning focused refractive-index microscopy

We present a novel scanning focused refractive-index microscopy (SFRIM) technique to obtain the refractive index (RI) profiles of objects. The method uses a focused laser as the light source, and combines the derivative total reflection method (DTRM), projection magnification, and scanning technique...

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Detalles Bibliográficos
Autores principales:	Sun, Teng-Qian, Ye, Qing, Wang, Xiao-Wan, Wang, Jin, Deng, Zhi-Chao, Mei, Jian-Chun, Zhou, Wen-Yuan, Zhang, Chun-Ping, Tian, Jian-Guo
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Nature Publishing Group 2014
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4090626/ https://www.ncbi.nlm.nih.gov/pubmed/25008374 http://dx.doi.org/10.1038/srep05647

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