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Absence of Evidence ≠ Evidence of Absence: Statistical Analysis of Inclusions in Multiferroic Thin Films

Assertions that a new material may offer particularly advantageous properties should always be subjected to careful critical evaluation, especially when those properties can be affected by the presence of inclusions at trace level. This is particularly important for claims relating to new multiferro...

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Detalles Bibliográficos
Autores principales: Schmidt, Michael, Amann, Andreas, Keeney, Lynette, Pemble, Martyn E., Holmes, Justin D., Petkov, Nikolay, Whatmore, Roger W.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2014
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4100018/
https://www.ncbi.nlm.nih.gov/pubmed/25026969
http://dx.doi.org/10.1038/srep05712