Cargando…
Thermal conductivity of highly porous Si in the temperature range 4.2 to 20 K
We report on experimental results of the thermal conductivity k of highly porous Si in the temperature range 4.2 to 20 K, obtained using the direct current (dc) method combined with thermal finite element simulations. The reported results are the first in the literature for this temperature range. I...
Autores principales: | Valalaki, Katerina, Nassiopoulou, Androula Galiouna |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Springer
2014
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4109793/ https://www.ncbi.nlm.nih.gov/pubmed/25114631 http://dx.doi.org/10.1186/1556-276X-9-318 |
Ejemplares similares
-
High Seebeck Coefficient of Porous Silicon: Study of the Porosity Dependence
por: Valalaki, Katerina, et al.
Publicado: (2016) -
Dielectric properties of porous silicon for use as a substrate for the on-chip integration of millimeter-wave devices in the frequency range 140 to 210 GHz
por: Sarafis, Panagiotis, et al.
Publicado: (2014) -
Si nanowires by a single-step metal-assisted chemical etching process on lithographically defined areas: formation kinetics
por: Nassiopoulou, Androula Galiouna, et al.
Publicado: (2011) -
Porous anodic alumina on galvanically grown PtSi layer for application in template-assisted Si nanowire growth
por: Michelakaki, Irini, et al.
Publicado: (2011) -
Structure, morphology, and photoluminescence of porous Si nanowires: effect of different chemical treatments
por: Leontis, Ioannis, et al.
Publicado: (2013)