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Large Area Stress Distribution in Crystalline Materials Calculated from Lattice Deformation Identified by Electron Backscatter Diffraction

We report a method to obtain the stress of crystalline materials directly from lattice deformation by Hooke's law. The lattice deformation was calculated using the crystallographic orientations obtained from electron backscatter diffraction (EBSD) technology. The stress distribution over a larg...

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Autores principales: Shao, Yongliang, Zhang, Lei, Hao, Xiaopeng, Wu, Yongzhong, Dai, Yuanbin, Tian, Yuan, Huo, Qin
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group 2014
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4121609/
https://www.ncbi.nlm.nih.gov/pubmed/25091314
http://dx.doi.org/10.1038/srep05934
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author Shao, Yongliang
Zhang, Lei
Hao, Xiaopeng
Wu, Yongzhong
Dai, Yuanbin
Tian, Yuan
Huo, Qin
author_facet Shao, Yongliang
Zhang, Lei
Hao, Xiaopeng
Wu, Yongzhong
Dai, Yuanbin
Tian, Yuan
Huo, Qin
author_sort Shao, Yongliang
collection PubMed
description We report a method to obtain the stress of crystalline materials directly from lattice deformation by Hooke's law. The lattice deformation was calculated using the crystallographic orientations obtained from electron backscatter diffraction (EBSD) technology. The stress distribution over a large area was obtained efficiently and accurately using this method. Wurtzite structure gallium nitride (GaN) crystal was used as the example of a hexagonal crystal system. With this method, the stress distribution of a GaN crystal was obtained. Raman spectroscopy was used to verify the stress distribution. The cause of the stress distribution found in the GaN crystal was discussed from theoretical analysis and EBSD data. Other properties related to lattice deformation, such as piezoelectricity, can also be analyzed by this novel approach based on EBSD data.
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spelling pubmed-41216092014-08-14 Large Area Stress Distribution in Crystalline Materials Calculated from Lattice Deformation Identified by Electron Backscatter Diffraction Shao, Yongliang Zhang, Lei Hao, Xiaopeng Wu, Yongzhong Dai, Yuanbin Tian, Yuan Huo, Qin Sci Rep Article We report a method to obtain the stress of crystalline materials directly from lattice deformation by Hooke's law. The lattice deformation was calculated using the crystallographic orientations obtained from electron backscatter diffraction (EBSD) technology. The stress distribution over a large area was obtained efficiently and accurately using this method. Wurtzite structure gallium nitride (GaN) crystal was used as the example of a hexagonal crystal system. With this method, the stress distribution of a GaN crystal was obtained. Raman spectroscopy was used to verify the stress distribution. The cause of the stress distribution found in the GaN crystal was discussed from theoretical analysis and EBSD data. Other properties related to lattice deformation, such as piezoelectricity, can also be analyzed by this novel approach based on EBSD data. Nature Publishing Group 2014-08-05 /pmc/articles/PMC4121609/ /pubmed/25091314 http://dx.doi.org/10.1038/srep05934 Text en Copyright © 2014, Macmillan Publishers Limited. All rights reserved http://creativecommons.org/licenses/by/4.0/ This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article's Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder in order to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/
spellingShingle Article
Shao, Yongliang
Zhang, Lei
Hao, Xiaopeng
Wu, Yongzhong
Dai, Yuanbin
Tian, Yuan
Huo, Qin
Large Area Stress Distribution in Crystalline Materials Calculated from Lattice Deformation Identified by Electron Backscatter Diffraction
title Large Area Stress Distribution in Crystalline Materials Calculated from Lattice Deformation Identified by Electron Backscatter Diffraction
title_full Large Area Stress Distribution in Crystalline Materials Calculated from Lattice Deformation Identified by Electron Backscatter Diffraction
title_fullStr Large Area Stress Distribution in Crystalline Materials Calculated from Lattice Deformation Identified by Electron Backscatter Diffraction
title_full_unstemmed Large Area Stress Distribution in Crystalline Materials Calculated from Lattice Deformation Identified by Electron Backscatter Diffraction
title_short Large Area Stress Distribution in Crystalline Materials Calculated from Lattice Deformation Identified by Electron Backscatter Diffraction
title_sort large area stress distribution in crystalline materials calculated from lattice deformation identified by electron backscatter diffraction
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4121609/
https://www.ncbi.nlm.nih.gov/pubmed/25091314
http://dx.doi.org/10.1038/srep05934
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