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Low-Energy Plasma Focus Device as an Electron Beam Source

A low-energy plasma focus device was used as an electron beam source. A technique was developed to simultaneously measure the electron beam intensity and energy. The system was operated in Argon filling at an optimum pressure of 1.7 mbar. A Faraday cup was used together with an array of filtered PIN...

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Detalles Bibliográficos
Autores principales: Khan, Muhammad Zubair, Seong Ling, Yap, Yaqoob, Ibrar, Naresh Kumar, Nitturi, Lian Kuang, Lim, Chiow San, Wong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Hindawi Publishing Corporation 2014
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4142785/
https://www.ncbi.nlm.nih.gov/pubmed/25544952
http://dx.doi.org/10.1155/2014/240729
Descripción
Sumario:A low-energy plasma focus device was used as an electron beam source. A technique was developed to simultaneously measure the electron beam intensity and energy. The system was operated in Argon filling at an optimum pressure of 1.7 mbar. A Faraday cup was used together with an array of filtered PIN diodes. The beam-target X-rays were registered through X-ray spectrometry. Copper and lead line radiations were registered upon usage as targets. The maximum electron beam charge and density were estimated to be 0.31 μC and 13.5 × 10(16)/m(3), respectively. The average energy of the electron beam was 500 keV. The high flux of the electron beam can be potentially applicable in material sciences.