Enhanced electrical properties in sub-10-nm WO(3) nanoflakes prepared via a two-step sol-gel-exfoliation method

The morphology and electrical properties of orthorhombic β-WO(3) nanoflakes with thickness of ~7 to 9 nm were investigated at the nanoscale with a combination of scanning electron microscopy (SEM), energy dispersive X-ray spectroscopy (EDX), current sensing force spectroscopy atomic force microscopy (CSFS-AFM, or PeakForce TUNA™), Fourier transform infra-red absorption spectroscopy (FTIR), linear sweep voltammetry (LSV) and Raman spectroscopy techniques. CSFS-AFM analysis established good correlation between the topography of the developed nanostructures and various features of WO(3) nanoflakes synthesized via a two-step sol-gel-exfoliation method. It was determined that β-WO(3) nanoflakes annealed at 550°C possess distinguished and exceptional thickness-dependent properties in comparison with the bulk, micro and nanostructured WO(3) synthesized at alternative temperatures.