Enhanced electrical properties in sub-10-nm WO(3) nanoflakes prepared via a two-step sol-gel-exfoliation method

The morphology and electrical properties of orthorhombic β-WO(3) nanoflakes with thickness of ~7 to 9 nm were investigated at the nanoscale with a combination of scanning electron microscopy (SEM), energy dispersive X-ray spectroscopy (EDX), current sensing force spectroscopy atomic force microscopy...

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Detalles Bibliográficos
Autores principales: Zhuiykov, Serge, Kats, Eugene
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2014
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4150682/
https://www.ncbi.nlm.nih.gov/pubmed/25221453
http://dx.doi.org/10.1186/1556-276X-9-401
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author Zhuiykov, Serge
Kats, Eugene
author_facet Zhuiykov, Serge
Kats, Eugene
author_sort Zhuiykov, Serge
collection PubMed
description The morphology and electrical properties of orthorhombic β-WO(3) nanoflakes with thickness of ~7 to 9 nm were investigated at the nanoscale with a combination of scanning electron microscopy (SEM), energy dispersive X-ray spectroscopy (EDX), current sensing force spectroscopy atomic force microscopy (CSFS-AFM, or PeakForce TUNA™), Fourier transform infra-red absorption spectroscopy (FTIR), linear sweep voltammetry (LSV) and Raman spectroscopy techniques. CSFS-AFM analysis established good correlation between the topography of the developed nanostructures and various features of WO(3) nanoflakes synthesized via a two-step sol-gel-exfoliation method. It was determined that β-WO(3) nanoflakes annealed at 550°C possess distinguished and exceptional thickness-dependent properties in comparison with the bulk, micro and nanostructured WO(3) synthesized at alternative temperatures.
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spelling pubmed-41506822014-09-12 Enhanced electrical properties in sub-10-nm WO(3) nanoflakes prepared via a two-step sol-gel-exfoliation method Zhuiykov, Serge Kats, Eugene Nanoscale Res Lett Nano Express The morphology and electrical properties of orthorhombic β-WO(3) nanoflakes with thickness of ~7 to 9 nm were investigated at the nanoscale with a combination of scanning electron microscopy (SEM), energy dispersive X-ray spectroscopy (EDX), current sensing force spectroscopy atomic force microscopy (CSFS-AFM, or PeakForce TUNA™), Fourier transform infra-red absorption spectroscopy (FTIR), linear sweep voltammetry (LSV) and Raman spectroscopy techniques. CSFS-AFM analysis established good correlation between the topography of the developed nanostructures and various features of WO(3) nanoflakes synthesized via a two-step sol-gel-exfoliation method. It was determined that β-WO(3) nanoflakes annealed at 550°C possess distinguished and exceptional thickness-dependent properties in comparison with the bulk, micro and nanostructured WO(3) synthesized at alternative temperatures. Springer 2014-08-18 /pmc/articles/PMC4150682/ /pubmed/25221453 http://dx.doi.org/10.1186/1556-276X-9-401 Text en Copyright © 2014 Zhuiykov and Kats; licensee Springer. http://creativecommons.org/licenses/by/4.0 This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly credited.
spellingShingle Nano Express
Zhuiykov, Serge
Kats, Eugene
Enhanced electrical properties in sub-10-nm WO(3) nanoflakes prepared via a two-step sol-gel-exfoliation method
title Enhanced electrical properties in sub-10-nm WO(3) nanoflakes prepared via a two-step sol-gel-exfoliation method
title_full Enhanced electrical properties in sub-10-nm WO(3) nanoflakes prepared via a two-step sol-gel-exfoliation method
title_fullStr Enhanced electrical properties in sub-10-nm WO(3) nanoflakes prepared via a two-step sol-gel-exfoliation method
title_full_unstemmed Enhanced electrical properties in sub-10-nm WO(3) nanoflakes prepared via a two-step sol-gel-exfoliation method
title_short Enhanced electrical properties in sub-10-nm WO(3) nanoflakes prepared via a two-step sol-gel-exfoliation method
title_sort enhanced electrical properties in sub-10-nm wo(3) nanoflakes prepared via a two-step sol-gel-exfoliation method
topic Nano Express
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4150682/
https://www.ncbi.nlm.nih.gov/pubmed/25221453
http://dx.doi.org/10.1186/1556-276X-9-401
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