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A Trustworthy Key Generation Prototype Based on DDR3 PUF for Wireless Sensor Networks

Secret key leakage in wireless sensor networks (WSNs) is a high security risk especially when sensor nodes are deployed in hostile environment and physically accessible to attackers. With nowadays semi/fully-invasive attack techniques attackers can directly derive the cryptographic key from non-vola...

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Detalles Bibliográficos
Autores principales: Liu, Wenchao, Zhang, Zhenhua, Li, Miaoxin, Liu, Zhenglin
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2014
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4168438/
https://www.ncbi.nlm.nih.gov/pubmed/24984058
http://dx.doi.org/10.3390/s140711542
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author Liu, Wenchao
Zhang, Zhenhua
Li, Miaoxin
Liu, Zhenglin
author_facet Liu, Wenchao
Zhang, Zhenhua
Li, Miaoxin
Liu, Zhenglin
author_sort Liu, Wenchao
collection PubMed
description Secret key leakage in wireless sensor networks (WSNs) is a high security risk especially when sensor nodes are deployed in hostile environment and physically accessible to attackers. With nowadays semi/fully-invasive attack techniques attackers can directly derive the cryptographic key from non-volatile memory (NVM) storage. Physically Unclonable Function (PUF) is a promising technology to resist node capture attacks, and it also provides a low cost and tamper-resistant key provisioning solution. In this paper, we designed a PUF based on double-data-rate SDRAM Type 3 (DDR3) memory by exploring its memory decay characteristics. We also described a prototype of 128-bit key generation based on DDR3 PUF with integrated fuzzy extractor. Due to the wide adoption of DDR3 memory in WSN, our proposed DDR3 PUF technology with high security levels and no required hardware changes is suitable for a wide range of WSN applications.
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spelling pubmed-41684382014-09-19 A Trustworthy Key Generation Prototype Based on DDR3 PUF for Wireless Sensor Networks Liu, Wenchao Zhang, Zhenhua Li, Miaoxin Liu, Zhenglin Sensors (Basel) Article Secret key leakage in wireless sensor networks (WSNs) is a high security risk especially when sensor nodes are deployed in hostile environment and physically accessible to attackers. With nowadays semi/fully-invasive attack techniques attackers can directly derive the cryptographic key from non-volatile memory (NVM) storage. Physically Unclonable Function (PUF) is a promising technology to resist node capture attacks, and it also provides a low cost and tamper-resistant key provisioning solution. In this paper, we designed a PUF based on double-data-rate SDRAM Type 3 (DDR3) memory by exploring its memory decay characteristics. We also described a prototype of 128-bit key generation based on DDR3 PUF with integrated fuzzy extractor. Due to the wide adoption of DDR3 memory in WSN, our proposed DDR3 PUF technology with high security levels and no required hardware changes is suitable for a wide range of WSN applications. MDPI 2014-06-30 /pmc/articles/PMC4168438/ /pubmed/24984058 http://dx.doi.org/10.3390/s140711542 Text en © 2014 by the authors; licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution license (http://creativecommons.org/licenses/by/3.0/).
spellingShingle Article
Liu, Wenchao
Zhang, Zhenhua
Li, Miaoxin
Liu, Zhenglin
A Trustworthy Key Generation Prototype Based on DDR3 PUF for Wireless Sensor Networks
title A Trustworthy Key Generation Prototype Based on DDR3 PUF for Wireless Sensor Networks
title_full A Trustworthy Key Generation Prototype Based on DDR3 PUF for Wireless Sensor Networks
title_fullStr A Trustworthy Key Generation Prototype Based on DDR3 PUF for Wireless Sensor Networks
title_full_unstemmed A Trustworthy Key Generation Prototype Based on DDR3 PUF for Wireless Sensor Networks
title_short A Trustworthy Key Generation Prototype Based on DDR3 PUF for Wireless Sensor Networks
title_sort trustworthy key generation prototype based on ddr3 puf for wireless sensor networks
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4168438/
https://www.ncbi.nlm.nih.gov/pubmed/24984058
http://dx.doi.org/10.3390/s140711542
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