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Vertical Soil Profiling Using a Galvanic Contact Resistivity Scanning Approach
Proximal sensing of soil electromagnetic properties is widely used to map spatial land heterogeneity. The mapping instruments use galvanic contact, capacitive coupling or electromagnetic induction. Regardless of the type of instrument, the geometrical configuration between signal transmitting and re...
Autores principales: | , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2014
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4168439/ https://www.ncbi.nlm.nih.gov/pubmed/25057135 http://dx.doi.org/10.3390/s140713243 |
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author | Pan, Luan Adamchuk, Viacheslav I. Prasher, Shiv Gebbers, Robin Taylor, Richard S. Dabas, Michel |
author_facet | Pan, Luan Adamchuk, Viacheslav I. Prasher, Shiv Gebbers, Robin Taylor, Richard S. Dabas, Michel |
author_sort | Pan, Luan |
collection | PubMed |
description | Proximal sensing of soil electromagnetic properties is widely used to map spatial land heterogeneity. The mapping instruments use galvanic contact, capacitive coupling or electromagnetic induction. Regardless of the type of instrument, the geometrical configuration between signal transmitting and receiving elements typically defines the shape of the depth response function. To assess vertical soil profiles, many modern instruments use multiple transmitter-receiver pairs. Alternatively, vertical electrical sounding can be used to measure changes in apparent soil electrical conductivity with depth at a specific location. This paper examines the possibility for the assessment of soil profiles using a dynamic surface galvanic contact resistivity scanning approach, with transmitting and receiving electrodes configured in an equatorial dipole-dipole array. An automated scanner system was developed and tested in agricultural fields with different soil profiles. While operating in the field, the distance between current injecting and measuring pairs of rolling electrodes was varied continuously from 40 to 190 cm. The preliminary evaluation included a comparison of scan results from 20 locations to shallow (less than 1.2 m deep) soil profiles and to a two-layer soil profile model defined using an electromagnetic induction instrument. |
format | Online Article Text |
id | pubmed-4168439 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2014 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-41684392014-09-19 Vertical Soil Profiling Using a Galvanic Contact Resistivity Scanning Approach Pan, Luan Adamchuk, Viacheslav I. Prasher, Shiv Gebbers, Robin Taylor, Richard S. Dabas, Michel Sensors (Basel) Article Proximal sensing of soil electromagnetic properties is widely used to map spatial land heterogeneity. The mapping instruments use galvanic contact, capacitive coupling or electromagnetic induction. Regardless of the type of instrument, the geometrical configuration between signal transmitting and receiving elements typically defines the shape of the depth response function. To assess vertical soil profiles, many modern instruments use multiple transmitter-receiver pairs. Alternatively, vertical electrical sounding can be used to measure changes in apparent soil electrical conductivity with depth at a specific location. This paper examines the possibility for the assessment of soil profiles using a dynamic surface galvanic contact resistivity scanning approach, with transmitting and receiving electrodes configured in an equatorial dipole-dipole array. An automated scanner system was developed and tested in agricultural fields with different soil profiles. While operating in the field, the distance between current injecting and measuring pairs of rolling electrodes was varied continuously from 40 to 190 cm. The preliminary evaluation included a comparison of scan results from 20 locations to shallow (less than 1.2 m deep) soil profiles and to a two-layer soil profile model defined using an electromagnetic induction instrument. MDPI 2014-07-23 /pmc/articles/PMC4168439/ /pubmed/25057135 http://dx.doi.org/10.3390/s140713243 Text en © 2014 by the authors; licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution license (http://creativecommons.org/licenses/by/3.0/). |
spellingShingle | Article Pan, Luan Adamchuk, Viacheslav I. Prasher, Shiv Gebbers, Robin Taylor, Richard S. Dabas, Michel Vertical Soil Profiling Using a Galvanic Contact Resistivity Scanning Approach |
title | Vertical Soil Profiling Using a Galvanic Contact Resistivity Scanning Approach |
title_full | Vertical Soil Profiling Using a Galvanic Contact Resistivity Scanning Approach |
title_fullStr | Vertical Soil Profiling Using a Galvanic Contact Resistivity Scanning Approach |
title_full_unstemmed | Vertical Soil Profiling Using a Galvanic Contact Resistivity Scanning Approach |
title_short | Vertical Soil Profiling Using a Galvanic Contact Resistivity Scanning Approach |
title_sort | vertical soil profiling using a galvanic contact resistivity scanning approach |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4168439/ https://www.ncbi.nlm.nih.gov/pubmed/25057135 http://dx.doi.org/10.3390/s140713243 |
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