Comparison of optimal performance at 300 keV of three direct electron detectors for use in low dose electron microscopy

Low dose electron imaging applications such as electron cryo-microscopy are now benefitting from the improved performance and flexibility of recently introduced electron imaging detectors in which electrons are directly incident on backthinned CMOS sensors. There are currently three commercially ava...

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Detalles Bibliográficos
Autores principales: McMullan, G., Faruqi, A.R., Clare, D., Henderson, R.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2014
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4199116/
https://www.ncbi.nlm.nih.gov/pubmed/25194828
http://dx.doi.org/10.1016/j.ultramic.2014.08.002

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4199116/
https://www.ncbi.nlm.nih.gov/pubmed/25194828
http://dx.doi.org/10.1016/j.ultramic.2014.08.002

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