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Comparison of optimal performance at 300 keV of three direct electron detectors for use in low dose electron microscopy
Low dose electron imaging applications such as electron cryo-microscopy are now benefitting from the improved performance and flexibility of recently introduced electron imaging detectors in which electrons are directly incident on backthinned CMOS sensors. There are currently three commercially ava...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Elsevier
2014
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4199116/ https://www.ncbi.nlm.nih.gov/pubmed/25194828 http://dx.doi.org/10.1016/j.ultramic.2014.08.002 |