Cargando…

Cathode lens spectromicroscopy: methodology and applications

The implementation of imaging techniques with low-energy electrons at synchrotron laboratories allowed for significant advancement in the field of spectromicroscopy. The spectroscopic photoemission and low energy electron microscope, SPELEEM, is a notable example. We summarize the multitechnique cap...

Descripción completa

Detalles Bibliográficos
Autores principales: Menteş, T O, Zamborlini, G, Sala, A, Locatelli, A
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2014
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4222408/
https://www.ncbi.nlm.nih.gov/pubmed/25383299
http://dx.doi.org/10.3762/bjnano.5.198
_version_ 1782343033824477184
author Menteş, T O
Zamborlini, G
Sala, A
Locatelli, A
author_facet Menteş, T O
Zamborlini, G
Sala, A
Locatelli, A
author_sort Menteş, T O
collection PubMed
description The implementation of imaging techniques with low-energy electrons at synchrotron laboratories allowed for significant advancement in the field of spectromicroscopy. The spectroscopic photoemission and low energy electron microscope, SPELEEM, is a notable example. We summarize the multitechnique capabilities of the SPELEEM instrument, reporting on the instrumental aspects and the latest developments on the technical side. We briefly review applications, which are grouped into two main scientific fields. The first one covers different aspects of graphene physics. In particular, we highlight the recent work on graphene/Ir(100). Here, SPELEEM was employed to monitor the changes in the electronic structure that occur for different film morphologies and during the intercalation of Au. The Au monolayer, which creeps under graphene from the film edges, efficiently decouples the graphene from the substrate lowering the Dirac energy from 0.42 eV to 0.1 eV. The second field combines magnetism studies at the mesoscopic length scale with self-organized systems featuring ordered nanostructures. This example highlights the possibility to monitor growth processes in real time and combine chemical characterization with X-ray magnetic circular dichroism–photoemission electron microscopy (XMCD–PEEM) magnetic imaging by using the variable photon polarization and energy available at the synchrotron source.
format Online
Article
Text
id pubmed-4222408
institution National Center for Biotechnology Information
language English
publishDate 2014
publisher Beilstein-Institut
record_format MEDLINE/PubMed
spelling pubmed-42224082014-11-07 Cathode lens spectromicroscopy: methodology and applications Menteş, T O Zamborlini, G Sala, A Locatelli, A Beilstein J Nanotechnol Review The implementation of imaging techniques with low-energy electrons at synchrotron laboratories allowed for significant advancement in the field of spectromicroscopy. The spectroscopic photoemission and low energy electron microscope, SPELEEM, is a notable example. We summarize the multitechnique capabilities of the SPELEEM instrument, reporting on the instrumental aspects and the latest developments on the technical side. We briefly review applications, which are grouped into two main scientific fields. The first one covers different aspects of graphene physics. In particular, we highlight the recent work on graphene/Ir(100). Here, SPELEEM was employed to monitor the changes in the electronic structure that occur for different film morphologies and during the intercalation of Au. The Au monolayer, which creeps under graphene from the film edges, efficiently decouples the graphene from the substrate lowering the Dirac energy from 0.42 eV to 0.1 eV. The second field combines magnetism studies at the mesoscopic length scale with self-organized systems featuring ordered nanostructures. This example highlights the possibility to monitor growth processes in real time and combine chemical characterization with X-ray magnetic circular dichroism–photoemission electron microscopy (XMCD–PEEM) magnetic imaging by using the variable photon polarization and energy available at the synchrotron source. Beilstein-Institut 2014-10-27 /pmc/articles/PMC4222408/ /pubmed/25383299 http://dx.doi.org/10.3762/bjnano.5.198 Text en Copyright © 2014, Menteş et al. https://creativecommons.org/licenses/by/2.0https://www.beilstein-journals.org/bjnano/termsThis is an Open Access article under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. The license is subject to the Beilstein Journal of Nanotechnology terms and conditions: (https://www.beilstein-journals.org/bjnano/terms)
spellingShingle Review
Menteş, T O
Zamborlini, G
Sala, A
Locatelli, A
Cathode lens spectromicroscopy: methodology and applications
title Cathode lens spectromicroscopy: methodology and applications
title_full Cathode lens spectromicroscopy: methodology and applications
title_fullStr Cathode lens spectromicroscopy: methodology and applications
title_full_unstemmed Cathode lens spectromicroscopy: methodology and applications
title_short Cathode lens spectromicroscopy: methodology and applications
title_sort cathode lens spectromicroscopy: methodology and applications
topic Review
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4222408/
https://www.ncbi.nlm.nih.gov/pubmed/25383299
http://dx.doi.org/10.3762/bjnano.5.198
work_keys_str_mv AT mentesto cathodelensspectromicroscopymethodologyandapplications
AT zamborlinig cathodelensspectromicroscopymethodologyandapplications
AT salaa cathodelensspectromicroscopymethodologyandapplications
AT locatellia cathodelensspectromicroscopymethodologyandapplications