A single poly-Si gate-all-around junctionless fin field-effect transistor for use in one-time programming nonvolatile memory

This work demonstrates a feasible single poly-Si gate-all-around (GAA) junctionless fin field-effect transistor (JL-FinFET) for use in one-time programming (OTP) nonvolatile memory (NVM) applications. The advantages of this device include the simplicity of its use and the ease with which it can be e...

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Detalles Bibliográficos
Autores principales: Yeh, Mu-Shih, Wu, Yung-Chun, Liu, Kuan-Cheng, Chung, Ming-Hsien, Jhan, Yi-Ruei, Hung, Min-Feng, Chen, Lun-Chun
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer 2014
Materias:
Nano Express
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4232527/
https://www.ncbi.nlm.nih.gov/pubmed/25404873
http://dx.doi.org/10.1186/1556-276X-9-603
Descripción
Sumario:This work demonstrates a feasible single poly-Si gate-all-around (GAA) junctionless fin field-effect transistor (JL-FinFET) for use in one-time programming (OTP) nonvolatile memory (NVM) applications. The advantages of this device include the simplicity of its use and the ease with which it can be embedded in Si wafer, glass, and flexible substrates. This device exhibits excellent retention, with a memory window maintained 2 V after 10(4) s. By extrapolation, 95% of the original charge can be stored for 10 years. In the future, this device will be applied to multi-layer Si ICs in fully functional systems on panels, active-matrix liquid-crystal displays, and three-dimensional (3D) stacked flash memory.

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