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Advanced atomic force microscopy techniques II

Detalles Bibliográficos
Autores principales: Glatzel, Thilo, Garcia, Ricardo, Schimmel, Thomas
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein Institute 2014
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4273268/
https://www.ncbi.nlm.nih.gov/pubmed/25551060
http://dx.doi.org/10.3762/bjnano.5.241
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author Glatzel, Thilo
Garcia, Ricardo
Schimmel, Thomas
author_facet Glatzel, Thilo
Garcia, Ricardo
Schimmel, Thomas
author_sort Glatzel, Thilo
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spelling pubmed-42732682014-12-30 Advanced atomic force microscopy techniques II Glatzel, Thilo Garcia, Ricardo Schimmel, Thomas Beilstein J Nanotechnol Editorial Beilstein Institute 2014-12-03 /pmc/articles/PMC4273268/ /pubmed/25551060 http://dx.doi.org/10.3762/bjnano.5.241 Text en Copyright © 2014, Glatzel et al. https://creativecommons.org/licenses/by/2.0https://www.beilstein-journals.org/bjnano/termsThis is an Open Access article under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. The license is subject to the Beilstein Journal of Nanotechnology terms and conditions: (https://www.beilstein-journals.org/bjnano/terms)
spellingShingle Editorial
Glatzel, Thilo
Garcia, Ricardo
Schimmel, Thomas
Advanced atomic force microscopy techniques II
title Advanced atomic force microscopy techniques II
title_full Advanced atomic force microscopy techniques II
title_fullStr Advanced atomic force microscopy techniques II
title_full_unstemmed Advanced atomic force microscopy techniques II
title_short Advanced atomic force microscopy techniques II
title_sort advanced atomic force microscopy techniques ii
topic Editorial
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4273268/
https://www.ncbi.nlm.nih.gov/pubmed/25551060
http://dx.doi.org/10.3762/bjnano.5.241
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