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Advanced atomic force microscopy techniques II

Detalles Bibliográficos
Autores principales:	Glatzel, Thilo, Garcia, Ricardo, Schimmel, Thomas
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Beilstein Institute 2014
Materias:	Editorial
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4273268/ https://www.ncbi.nlm.nih.gov/pubmed/25551060 http://dx.doi.org/10.3762/bjnano.5.241

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