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Ex situ and in situ characterization of patterned photoreactive thin organic surface layers using friction force microscopy

Photolithographic methods allow an easy lateral top-down patterning and tuning of surface properties with photoreactive molecules and polymers. Employing friction force microscopy (FFM), we present here different FFM-based methods that enable the characterization of several photoreactive thin organi...

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Detalles Bibliográficos
Autores principales:	Shen, Quan, Edler, Matthias, Griesser, Thomas, Knall, Astrid-Caroline, Trimmel, Gregor, Kern, Wolfgang, Teichert, Christian
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Wiley Periodicals, Inc 2014
Materias:	Original Articles
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4286208/ https://www.ncbi.nlm.nih.gov/pubmed/25183629 http://dx.doi.org/10.1002/sca.21159

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