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Growth and dislocation studies of β-HMX

BACKGROUND: The defect structure of organic materials is important as it plays a major role in their crystal growth properties. It also can play a subcritical role in “hot-spot” detonation processes of energetics and one such energetic is cyclotetramethylene-tetranitramine, in the commonly used beta...

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Autores principales: Gallagher, Hugh G, Sherwood, John N, Vrcelj, Ranko M
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer International Publishing 2014
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4317510/
https://www.ncbi.nlm.nih.gov/pubmed/25657816
http://dx.doi.org/10.1186/s13065-014-0075-y
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author Gallagher, Hugh G
Sherwood, John N
Vrcelj, Ranko M
author_facet Gallagher, Hugh G
Sherwood, John N
Vrcelj, Ranko M
author_sort Gallagher, Hugh G
collection PubMed
description BACKGROUND: The defect structure of organic materials is important as it plays a major role in their crystal growth properties. It also can play a subcritical role in “hot-spot” detonation processes of energetics and one such energetic is cyclotetramethylene-tetranitramine, in the commonly used beta form (β-HMX). RESULTS: The as-grown crystals grown by evaporation from acetone show prismatic, tabular and columnar habits, all with {011}, {110}, (010) and (101) faces. Etching on (010) surfaces revealed three different types of etch pits, two of which could be identified with either pure screw or pure edge dislocations, the third is shown to be an artifact of the twinning process that this material undergoes. Examination of the {011} and {110} surfaces show only one type of etch pit on each surface; however their natural asymmetry precludes the easy identification of their Burgers vector or dislocation type. Etching of cleaved {011} surfaces demonstrates that the etch pits can be associated with line dislocations. All dislocations appear randomly on the crystal surfaces and do not form alignments characteristic of mechanical deformation by dislocation slip. CONCLUSIONS: Crystals of β-HMX grown from acetone show good morphological agreement with that predicted by modelling, with three distinct crystal habits observed depending upon the supersaturation of the growth solution. Prismatic habit was favoured at low supersaturation, while tabular and columnar crystals were predominant at higher super saturations. The twin plane in β-HMX was identified as a (101) reflection plane. The low plasticity of β-HMX is shown by the lack of etch pit alignments corresponding to mechanically induced dislocation arrays. On untwinned {010} faces, two types of dislocations exist, pure edge dislocations with b = [010] and pure screw dislocations with b = [010]. On twinned (010) faces, a third dislocation type exists and it is proposed that these pits are associated with pure screw dislocations with b = [010]. [Figure: see text]
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spelling pubmed-43175102015-02-06 Growth and dislocation studies of β-HMX Gallagher, Hugh G Sherwood, John N Vrcelj, Ranko M Chem Cent J Research Article BACKGROUND: The defect structure of organic materials is important as it plays a major role in their crystal growth properties. It also can play a subcritical role in “hot-spot” detonation processes of energetics and one such energetic is cyclotetramethylene-tetranitramine, in the commonly used beta form (β-HMX). RESULTS: The as-grown crystals grown by evaporation from acetone show prismatic, tabular and columnar habits, all with {011}, {110}, (010) and (101) faces. Etching on (010) surfaces revealed three different types of etch pits, two of which could be identified with either pure screw or pure edge dislocations, the third is shown to be an artifact of the twinning process that this material undergoes. Examination of the {011} and {110} surfaces show only one type of etch pit on each surface; however their natural asymmetry precludes the easy identification of their Burgers vector or dislocation type. Etching of cleaved {011} surfaces demonstrates that the etch pits can be associated with line dislocations. All dislocations appear randomly on the crystal surfaces and do not form alignments characteristic of mechanical deformation by dislocation slip. CONCLUSIONS: Crystals of β-HMX grown from acetone show good morphological agreement with that predicted by modelling, with three distinct crystal habits observed depending upon the supersaturation of the growth solution. Prismatic habit was favoured at low supersaturation, while tabular and columnar crystals were predominant at higher super saturations. The twin plane in β-HMX was identified as a (101) reflection plane. The low plasticity of β-HMX is shown by the lack of etch pit alignments corresponding to mechanically induced dislocation arrays. On untwinned {010} faces, two types of dislocations exist, pure edge dislocations with b = [010] and pure screw dislocations with b = [010]. On twinned (010) faces, a third dislocation type exists and it is proposed that these pits are associated with pure screw dislocations with b = [010]. [Figure: see text] Springer International Publishing 2014-12-19 /pmc/articles/PMC4317510/ /pubmed/25657816 http://dx.doi.org/10.1186/s13065-014-0075-y Text en © Gallagher et al.; licensee Springer. 2014 This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly credited.
spellingShingle Research Article
Gallagher, Hugh G
Sherwood, John N
Vrcelj, Ranko M
Growth and dislocation studies of β-HMX
title Growth and dislocation studies of β-HMX
title_full Growth and dislocation studies of β-HMX
title_fullStr Growth and dislocation studies of β-HMX
title_full_unstemmed Growth and dislocation studies of β-HMX
title_short Growth and dislocation studies of β-HMX
title_sort growth and dislocation studies of β-hmx
topic Research Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4317510/
https://www.ncbi.nlm.nih.gov/pubmed/25657816
http://dx.doi.org/10.1186/s13065-014-0075-y
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